2096 search results - page 264 / 420 » Structured Parameter Elicitation |
158
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DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
15 years 11 months ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
143
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SLS
2009
Springer
15 years 11 months ago
2009
Springer
Stochastic local search algorithms can now successfully solve MAXSAT problems with thousands of variables or more. A key to this success is how effectively the search can navigate...
169
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LATIN
2010
Springer
15 years 11 months ago
2010
Springer
We consider the multiplication of a sparse N × N matrix A with a dense N × N matrix B in the I/O model. We determine the worst-case non-uniform complexity of this task up to a c...
136
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CIMCA
2008
IEEE
15 years 11 months ago
2008
IEEE
A relatively new technique for measuring the 3D structure of visual scenes is provided by time of flight (TOF) cameras. Reflections of modulated light waves are recorded by a pa...
157
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ETFA
2008
IEEE
15 years 11 months ago
2008
IEEE
Programmable Logic Controllers (PLCs) play a significant role in the control of production systems and Sequential Function Chart (SFC) is one of the main programming languages. Th...