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GLVLSI
2006
IEEE
101views VLSI» more  GLVLSI 2006»
15 years 10 months ago
Measurement and characterization of pattern dependent process variations of interconnect resistance, capacitance and inductance
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
Xiaoning Qi, Alex Gyure, Yansheng Luo, Sam C. Lo, ...
HPDC
2006
IEEE
15 years 10 months ago
Peer to peer size estimation in large and dynamic networks: A comparative study
As the size of distributed systems keeps growing, the peer to peer communication paradigm has been identified as the key to scalability. Peer to peer overlay networks are charact...
Erwan Le Merrer, Anne-Marie Kermarrec, Laurent Mas...
ICDM
2006
IEEE
133views Data Mining» more  ICDM 2006»
15 years 10 months ago
An Experimental Investigation of Graph Kernels on a Collaborative Recommendation Task
This work presents a systematic comparison between seven kernels (or similarity matrices) on a graph, namely the exponential diffusion kernel, the Laplacian diffusion kernel, the ...
François Fouss, Luh Yen, Alain Pirotte, Mar...
ICRA
2006
IEEE
106views Robotics» more  ICRA 2006»
15 years 10 months ago
An Improved Method for the Geometrical Calibration of Parallelogram-based Parallel Robots
: This paper presents an improved method for the geometrical calibration of parallel robots for which the structure is based upon some parallelogram mechanisms. Its originality is ...
Ludovic Savoure, Patrick Maurine, David Corbel, S&...
IJCNN
2006
IEEE
15 years 10 months ago
Semi-Supervised Model Selection Based on Cross-Validation
We propose a new semi-supervised model selection method that is derived by applying the structural risk minimization principle to a recent semi-supervised generalization error bou...
Matti Kaariainen