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ICCAD
2008
IEEE
98views Hardware» more  ICCAD 2008»
16 years 29 days ago
Statistical path selection for at-speed test
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
Vladimir Zolotov, Jinjun Xiong, Hanif Fatemi, Chan...
INFOCOM
2008
IEEE
15 years 10 months ago
Minimum Cost Data Aggregation with Localized Processing for Statistical Inference
—The problem of minimum cost in-network fusion of measurements, collected from distributed sensors via multihop routing is considered. A designated fusion center performs an opti...
Animashree Anandkumar, Lang Tong, Ananthram Swami,...
VTS
2008
IEEE
70views Hardware» more  VTS 2008»
15 years 10 months ago
A Statistical Approach to Characterizing and Testing Functionalized Nanowires
Unlike the top-down photolithographic CMOS VLSI process, cost-effective bulk fabrication of nanodevices calls for a bottom-up approach, generally called self-assembly. Selfassembl...
James Dardig, Haralampos-G. D. Stratigopoulos, Eri...
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ISBI
2007
IEEE
15 years 10 months ago
Wavelet-Based Statistical Analysis for Optical Imaging in Mouse Olfactory Bulb
Optical imaging is a powerful technique to map brain function in animals. In this study, we consider in vivo optical imaging of the murine olfactory bulb, using an intrinsic signa...
Dimitri Van De Ville, Brice Bathellier, Alan Carle...
GLVLSI
2006
IEEE
113views VLSI» more  GLVLSI 2006»
15 years 10 months ago
Statistical gate delay calculation with crosstalk alignment consideration
We study gate delay variation caused by crosstalk aggressor alignment, i.e., difference of signal arrival times in coupled neighboring interconnects. This effect is as significan...
Andrew B. Kahng, Bao Liu, Xu Xu