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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
15 years 11 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
ICCV
2007
IEEE
15 years 11 months ago
Simultaneous Segmentation and 3D Reconstruction of Monocular Image Sequences
When trying to extract 3D scene information and camera motion from an image sequence alone, it is often necessary to cope with independently moving objects. Recent research has un...
Kemal Egemen Ozden, Konrad Schindler, Luc J. Van G...
DILS
2007
Springer
15 years 11 months ago
Fast Approximate Duplicate Detection for 2D-NMR Spectra
2D-Nuclear magnetic resonance (NMR) spectroscopy is a powerful analytical method to elucidate the chemical structure of molecules. In contrast to 1D-NMR spectra, 2D-NMR spectra cor...
Björn Egert, Steffen Neumann, Alexander Hinne...
GECCO
2007
Springer
300views Optimization» more  GECCO 2007»
15 years 11 months ago
Methodology to select solutions from the pareto-optimal set: a comparative study
The resolution of a Multi-Objective Optimization Problem (MOOP) does not end when the Pareto-optimal set is found. In real problems, a single solution must be selected. Ideally, t...
José C. Ferreira, Carlos M. Fonseca, Ant&oa...
SEMWEB
2007
Springer
15 years 11 months ago
X-SOM Results for OAEI 2007
This paper summarizes the results of the X-SOM tool in the OAEI 2007 campaign. X-SOM is an extensible ontology mapper that combines various matching algorithms by means of a feed-f...
Carlo Curino, Giorgio Orsi, Letizia Tanca