2825 search results - page 141 / 565 » Support for Object-Oriented Testing |
118
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ISESE
2003
IEEE
15 years 9 months ago
2003
IEEE
The two most common strategies for verification and validation, inspection and testing, are in a controlled experiment evaluated in terms of their fault detection capabilities. Th...
131
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ICCAD
2000
IEEE
15 years 8 months ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
167
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ATS
2001
IEEE
15 years 7 months ago
2001
IEEE
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
122
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COMPSAC
2010
IEEE
15 years 2 months ago
2010
IEEE
Abstract--Test cost minimisation approaches have traditionally been devoted to minimising "execution costs", while maximising coverage or reliability. However, in a runti...
172
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ECCC
2011
14 years 11 months ago
2011
We develop a new technique for proving lower bounds in property testing, by showing a strong connection between testing and communication complexity. We give a simple scheme for r...