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ICSE
2009
IEEE-ACM
15 years 9 months ago
WISE: Automated test generation for worst-case complexity
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to ...
Jacob Burnim, Sudeep Juvekar, Koushik Sen
POPL
2009
ACM
16 years 3 months ago
Compositional shape analysis by means of bi-abduction
This paper describes a compositional shape analysis, where each procedure is analyzed independently of its callers. The analysis uses an abstract domain based on a restricted frag...
Cristiano Calcagno, Dino Distefano, Peter W. O'Hea...
ISCA
2010
IEEE
219views Hardware» more  ISCA 2010»
15 years 8 months ago
Using hardware vulnerability factors to enhance AVF analysis
Fault tolerance is now a primary design constraint for all major microprocessors. One step in determining a processor’s compliance to its failure rate target is measuring the Ar...
Vilas Sridharan, David R. Kaeli
SAS
1999
Springer
15 years 7 months ago
Eliminating Dead Code on Recursive Data
This paper describes a powerful method for dead code analysis and elimination in the presence of recursive data constructions. We describe partially dead recursive data using live...
Yanhong A. Liu, Scott D. Stoller
ASPLOS
2006
ACM
15 years 9 months ago
HeapMD: identifying heap-based bugs using anomaly detection
We present the design, implementation, and evaluation of HeapMD, a dynamic analysis tool that finds heap-based bugs using anomaly detection. HeapMD is based upon the observation ...
Trishul M. Chilimbi, Vinod Ganapathy