171 search results - page 18 / 35 » Synthesis of Efficient Linear Test Pattern Generators |
111
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HIS
2001
15 years 1 months ago
2001
Abstract. Linear Discriminant (LD) techniques are typically used in pattern recognition tasks when there are many (n >> 104 ) datapoints in low-dimensional (d < 102 ) spac...
DSD
2006
IEEE
15 years 5 months ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
88
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IBPRIA
2007
Springer
15 years 6 months ago
2007
Springer
Abstract. Piecewise-linear methods accomplish the registration by dividing the images in corresponding triangular patches, which are individually mapped through affine transformati...
DAC
2005
ACM
15 years 1 months ago
2005
ACM
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
108
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ICES
2000
Springer
15 years 3 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...