87 search results - page 7 / 18 » Synthesis of Testable RTL Designs |
VTS
1996
IEEE
15 years 1 months ago
1996
IEEE
Designing a testable circuit is often a two step process. First, the circuit is designed to conform to the functional specifications. Then, the testability aspects are added. By t...
DAC
2006
ACM
15 years 10 months ago
2006
ACM
Ever-growing complexity is forcing design to move above RTL. For example, golden functional models are being written as clearly as possible in software and not optimized or intend...
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ITC
1994
IEEE
15 years 1 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
ATS
2005
IEEE
15 years 3 months ago
2005
IEEE
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing...
VLSID
2006
IEEE
15 years 3 months ago
2006
IEEE
This tutorial focuses on advanced techniques to cope with the complexity of designing modern digital chips which are complete systems often containing multiple processors, complex...