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ATS
1998
IEEE
15 years 1 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
DAC
2002
ACM
15 years 10 months ago
2002
ACM
We have developed a generic integer linear programming(ILP)based engineering change(EC) methodology. The EC methodology has three components: enabling, fast, and preserving. Enabl...
ASPDAC
2005
ACM
15 years 3 months ago
2005
ACM
The progressive trend of fabrication technologies towards the nanometer regime has created a number of new physical design challenges for computer architects. Design complexity, u...
ICCAD
1997
IEEE
15 years 1 months ago
1997
IEEE
Technology-independenttimingoptimizationis animportantproblem in logic synthesis. Although many promising techniques have been proposed in the past, unfortunately they are quite s...
ASPDAC
2007
ACM
15 years 1 months ago
2007
ACM
Abstract-- SAT sweeping is the process of merging two or more functionally equivalent nodes in a circuit by selecting one of them to represent all the other equivalent nodes. This ...