In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Temporal Action Logics (TAL) is a class of temporal logics for reasoning about actions. We present a reformulation of TAL in Answer Set Programming (ASP), and discuss some synergi...
The dependency pair method of Arts and Giesl is the most powerful technique for proving termination of term rewrite systems automatically. We show that the method can be improved b...
This work proposes a new problem of identifying large and tangled logic structures in a synthesized netlist. Large groups of cells that are highly interconnected to each other can...
Tanuj Jindal, Charles J. Alpert, Jiang Hu, Zhuo Li...
— In this paper, we present a high-level power model to estimate the power consumption in semi-global and global interconnects. Such interconnects are used for communications bet...