198 search results - page 15 / 40 » Synthesizing racy tests |
ATS
2005
IEEE
15 years 3 months ago
2005
IEEE
— Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance, can result in improved test cost and test confid...
DATE
1998
IEEE
15 years 1 months ago
1998
IEEE
Built-in self-test BIST techniques modify functional hardware to give a data path the capability to test itself. The modi cation of data path registers into registers BIST resourc...
VTS
1996
IEEE
15 years 1 months ago
1996
IEEE
Designing a testable circuit is often a two step process. First, the circuit is designed to conform to the functional specifications. Then, the testability aspects are added. By t...
DSD
2005
IEEE
14 years 11 months ago
2005
IEEE
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...
112
Voted
IJDAR
2002
14 years 9 months ago
2002
Abstract. This paper describes a performance evaluation study in which some efficient classifiers are tested in handwritten digit recognition. The evaluated classifiers include a s...