In network performance tomography, characteristics of the network interior are inferred by correlating end-to-end measurements. In much previous work, the presence of correlations...
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...
Andrey V. Zykov, Elias Mizan, Margarida F. Jacome,...
This paper describes our experiences in the development of the UDP-based Data Transport (UDT) protocol, an application level transport protocol used in distributed data intensive ...
—It is generally acknowledged that nanoelectronics will eventually replace traditional silicon CMOS in high-performance integrated circuits. To that end, considerable investments...
For data dominated applications, the system level design trajectory should first focus on finding a good data transfer and storage solution. Since no realization details are avail...
Per Gunnar Kjeldsberg, Francky Catthoor, Einar J. ...