7 search results - page 2 / 2 » System level leakage reduction considering the interdependen... |
ISLPED
2006
ACM
14 years 5 days ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
CODES
2007
IEEE
14 years 17 days ago
2007
IEEE
3D stacked wafer integration has the potential to improve multiprocessor system-on-chip (MPSoC) integration density, performance, and power efficiency. However, the power density...