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» System-in-Package Testing: Problems and Solutions
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ETS
2010
IEEE
174views Hardware» more  ETS 2010»
15 years 27 days ago
Test-architecture optimization for TSV-based 3D stacked ICs
Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D s...
Brandon Noia, Sandeep Kumar Goel, Krishnendu Chakr...
CP
2009
Springer
15 years 3 months ago
Constraint-Based Local Search for the Automatic Generation of Architectural Tests
Abstract. This paper considers the automatic generation of architectural tests (ATGP), a fundamental problem in processor validation. ATGPs are complex conditional constraint satis...
Pascal Van Hentenryck, Carleton Coffrin, Boris Gut...
ANOR
2010
123views more  ANOR 2010»
14 years 12 months ago
Nature inspired genetic algorithms for hard packing problems
This paper presents two novel genetic algorithms (GAs) for hard industrially relevant packing problems. The design of both algorithms is inspired by aspects of molecular genetics,...
Philipp Rohlfshagen, John A. Bullinaria
INFORMATICALT
2006
108views more  INFORMATICALT 2006»
14 years 11 months ago
Experiments with Hybrid Genetic Algorithm for the Grey Pattern Problem
Recently, genetic algorithms (GAs) and their hybrids have achieved great success in solving difficult combinatorial optimization problems. In this paper, the issues related to the ...
Alfonsas Misevicius
COR
2008
133views more  COR 2008»
14 years 11 months ago
A new constraint programming approach for the orthogonal packing problem
The two-dimensional orthogonal packing problem (2OPP) consists in determining if a set of rectangles can be packed in a larger rectangle of fixed size. We propose an exact method ...
François Clautiaux, Antoine Jouglet, Jacque...