1177 search results - page 19 / 236 » System-in-Package Testing: Problems and Solutions |
TIT
2010
14 years 4 months ago
2010
In this work a method for statistical analysis of time series is proposed, which is used to obtain solutions to some classical problems of mathematical statistics under the only as...
ISQED
2003
IEEE
15 years 2 months ago
2003
IEEE
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
ISSRE
2007
IEEE
14 years 11 months ago
2007
IEEE
Model-checkers are powerful tools that can find individual traces through models to satisfy desired properties. These traces provide solutions to a number of problems. Instead of...
CCGRID
2007
IEEE
15 years 4 months ago
2007
IEEE
The Grid promise is starting to materialize today: largescale multi-site infrastructures have grown to assist the work of scientists from all around the world. This tremendous gro...
94
Voted
ASPDAC
2004
ACM
15 years 3 months ago
2004
ACM
— We examine an abstract formulation of BIST diagnosis in digital logic systems. The BIST diagnosis problem has applications that include identification of erroneous test vector...