1177 search results - page 225 / 236 » System-in-Package Testing: Problems and Solutions |
DAC
2009
ACM
15 years 2 months ago
2009
ACM
Process scaling has given designers billions of transistors to work with. As feature sizes near the atomic scale, extensive variation and wearout inevitably make margining unecono...
CVPR
2008
IEEE
15 years 11 months ago
2008
IEEE
Nearest neighbour classifiers and related kernel methods often perform poorly in high dimensional problems because it is infeasible to include enough training samples to cover the...
SSDBM
2005
IEEE
15 years 3 months ago
2005
IEEE
Recent advancements in sensor technology have made it possible to collect enormous amounts of data in real time. However, because of the sheer volume of data most of it will never...
DAC
2005
ACM
15 years 10 months ago
2005
ACM
We present an efficient optimization scheme for gate sizing in the presence of process variations. Using a posynomial delay model, the delay constraints are modified to incorporat...
84
Voted
HPCA
2009
IEEE
15 years 10 months ago
2009
IEEE
The number of functional errors escaping design verification and being released into final silicon is growing, due to the increasing complexity and shrinking production schedules ...