1177 search results - page 40 / 236 » System-in-Package Testing: Problems and Solutions |
DAC
2008
ACM
15 years 10 months ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
VLSID
2002
IEEE
15 years 10 months ago
2002
IEEE
We present a mathematical model for the problem of scheduling tests for core-based system-on-chip (SOC) VLSI designs. Given a set of tests for each core in the SOC and a set of te...
SIGUCCS
2000
ACM
15 years 2 months ago
2000
ACM
After thirty-plus years of making small “mid-course corrections” types of changes to the support paradigm, many on the Iowa State University campus thought it was time to make...
ICC
2007
IEEE
15 years 4 months ago
2007
IEEE
— – Major research challenges in the next generation of wireless networks include the provisioning of worldwide seamless mobility across heterogeneous wireless networks, the im...
IJCAI
2001
14 years 11 months ago
2001
Much excitement has been generated by the success of stochastic local search procedures at finding solutions to large, very hard satisfiability problems. Many of the problems on wh...