ract: Problem Statement and Hypothetical Solutions Shaukat Ali Verification and Testing Group (VT) Department of Computer Science University of Sheffield
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
1 Learnable Evolution Model (LEM) is a form of non-Darwinian evolutionary computation that employs machine learning to guide evolutionary processes. Its main novelty are new type o...
Recent years have seen the emergence of dropletbased microfluidic systems for safety-critical biomedical applications. In order to ensure reliability, microsystems incorporating m...