1177 search results - page 50 / 236 » System-in-Package Testing: Problems and Solutions |
INFOCOM
1995
IEEE
15 years 1 months ago
1995
IEEE
Establishing a multicast tree in a point-to-point network of switch nodes, such as a wide-area ATM network, is often modeled as the NP-complete Steiner problem in networks. In thi...
VLSID
2002
IEEE
15 years 10 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
TACAS
2005
Springer
15 years 3 months ago
2005
Springer
This paper addresses the problem of generating symbolic test cases for testing the conformance of a black-box implementation with respect to a specification, in the context of rea...
ITC
2003
IEEE
15 years 3 months ago
2003
IEEE
At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful applic...
ITC
2003
IEEE
15 years 3 months ago
2003
IEEE
Prior to the mid 1980s, the dominance of through-hole packaging of integrated circuits (ICs) provided easy access to nearly every pin of every chip on a printed circuit board. Pro...