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IFIP
2001
Springer
15 years 2 months ago
Random Adjacent Sequences: An Efficient Solution for Logic BIST
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
René David, Patrick Girard, Christian Landr...
CVPR
2000
IEEE
15 years 2 months ago
Step towards Sequence-to-Sequence Alignment
This paper presents an approach for establishing correspondencesin time and in space between two differentvideo sequences of the same dynamic scene, recorded by stationary uncalib...
Yaron Caspi, Michal Irani
DFT
2000
IEEE
105views VLSI» more  DFT 2000»
15 years 2 months ago
Low-Speed Scan Testing of Charge-Sharing Faults for CMOS Domino Circuits
Because domino logic design offers smaller area and higher speed than complementary CMOS design, it has been very popularly used to design highperformance processors. However: dom...
Ching-Hwa Cheng, Jinn-Shyan Wang, Shih-Chieh Chang...
HICSS
2000
IEEE
118views Biometrics» more  HICSS 2000»
15 years 2 months ago
Discourse Segmentation in Aid of Document Summarization
This paper describes work to enhance a sentencebased summarizer with notions of salience, dynamicallyadjustable summary size, discourse segmentation, and awareness of topic shifts...
Branimir Boguraev, Mary S. Neff
ICRA
2000
IEEE
129views Robotics» more  ICRA 2000»
15 years 2 months ago
Data Association for Mobile Robot Navigation: A Graph Theoretic Approach
Data association is the process of relating features observed in the environment to features viewed previously or to features in a map. Correct feature association is essential fo...
Tim Bailey, Eduardo Mario Nebot, Julio Rosenblatt,...