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130
Voted
TCAD
2002
15 years 4 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
165
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TEC
2008
15 years 4 months ago
2008
In this paper, we propose an evolutionary approach to the design of output codes for multiclass pattern recognition problems. This approach has the advantage of taking into account...
153
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CIVR
2010
Springer
15 years 3 months ago
2010
Springer
Human motion can be seen as a type of texture pattern. In this paper, we adopt the ideas of spatiotemporal analysis and the use of local features for motion description. movements...
133
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COMPSAC
2010
IEEE
15 years 3 months ago
2010
IEEE
Web services and service-oriented architecture (SOA) have become the de facto standard for designing distributed and loosely coupled applications. Many servicebased applications de...
149
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ICCAD
2009
IEEE
15 years 2 months ago
2009
IEEE
This paper accurately considers wire short defects and proposes an algorithm to guarantee IC chip yield rate improvement for redundant wire insertion. Without considering yield ra...