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DAC
2007
ACM
16 years 4 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
ICS
2009
Tsinghua U.
15 years 10 months ago
Performance modeling and automatic ghost zone optimization for iterative stencil loops on GPUs
Iterative stencil loops (ISLs) are used in many applications and tiling is a well-known technique to localize their computation. When ISLs are tiled across a parallel architecture...
Jiayuan Meng, Kevin Skadron
VLDB
2007
ACM
124views Database» more  VLDB 2007»
15 years 9 months ago
Ad-hoc Top-k Query Answering for Data Streams
A top-k query retrieves the k highest scoring tuples from a data set with respect to a scoring function defined on the attributes of a tuple. The efficient evaluation of top-k q...
Gautam Das, Dimitrios Gunopulos, Nick Koudas, Niko...
MOBISYS
2008
ACM
16 years 2 months ago
Cascadia: a system for specifying, detecting, and managing rfid events
Cascadia is a system that provides RFID-based pervasive computing applications with an infrastructure for specifying, extracting and managing meaningful high-level events from raw...
Evan Welbourne, Nodira Khoussainova, Julie Letchne...
CANPC
2000
Springer
15 years 7 months ago
Transparent Network Connectivity in Dynamic Cluster Environments
Improvements in microprocessor and networking performance have made networks of workstations a very attractive platform for high-end parallel and distributed computing. However, t...
Xiaodong Fu, Hua Wang, Vijay Karamcheti