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DAC
2007
ACM
15 years 10 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
ICS
2009
Tsinghua U.
15 years 4 months ago
Performance modeling and automatic ghost zone optimization for iterative stencil loops on GPUs
Iterative stencil loops (ISLs) are used in many applications and tiling is a well-known technique to localize their computation. When ISLs are tiled across a parallel architecture...
Jiayuan Meng, Kevin Skadron
VLDB
2007
ACM
124views Database» more  VLDB 2007»
15 years 3 months ago
Ad-hoc Top-k Query Answering for Data Streams
A top-k query retrieves the k highest scoring tuples from a data set with respect to a scoring function defined on the attributes of a tuple. The efficient evaluation of top-k q...
Gautam Das, Dimitrios Gunopulos, Nick Koudas, Niko...
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MOBISYS
2008
ACM
15 years 9 months ago
Cascadia: a system for specifying, detecting, and managing rfid events
Cascadia is a system that provides RFID-based pervasive computing applications with an infrastructure for specifying, extracting and managing meaningful high-level events from raw...
Evan Welbourne, Nodira Khoussainova, Julie Letchne...
CANPC
2000
Springer
15 years 2 months ago
Transparent Network Connectivity in Dynamic Cluster Environments
Improvements in microprocessor and networking performance have made networks of workstations a very attractive platform for high-end parallel and distributed computing. However, t...
Xiaodong Fu, Hua Wang, Vijay Karamcheti