Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...
The reliability of ADCs used in highly critical systems can be increased by applying a two-step procedure starting with sensitivity analysis followed by redesign. The sensitivity ...
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
High frequency digital LSIs usually consist of many subcircuits coupled with multi-conductor interconnects embedded in the substrate. They sometimes cause serious problems of the ...
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...