In Volume Rendering, it is difficult to simultaneously visualize interior and exterior structures. Several approaches have been developed to solve this problem, such as cut-away ...
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
The design of safety-critical systems has typically adopted static techniques to simplify error detection and fault tolerance. However, economic pressure to reduce costs is exposi...
Design space exploration of embedded systems typically focuses on classical design goals such as cost, timing, buffer sizes, and power consumption. Robustness criteria, i.e. sensi...