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» Temporal Analysis of Time Bounded Digital Systems
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DAC
2007
ACM
15 years 10 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
HICSS
2007
IEEE
136views Biometrics» more  HICSS 2007»
15 years 4 months ago
Analog and Hybrid Computation Approaches for Static Power Flow
Analog and hybrid computation methods are areas of continued interest, particularly in specific applications where traditional digital computation techniques cannot achieve the de...
Aaron St. Leger, Chika O. Nwankpa
ICDE
2009
IEEE
182views Database» more  ICDE 2009»
15 years 11 months ago
Environmental Monitoring 2.0
A sensor network data gathering and visualization infrastructure is demonstrated, comprising of Global Sensor Networks (GSN) middleware and Microsoft SensorMap. Users are invited t...
Sebastian Michel, Ali Salehi, Liqian Luo, Nicholas...
WISE
2007
Springer
15 years 4 months ago
A Semantic Approach and a Web Tool for Contextual Annotation of Photos Using Camera Phones
The increasing number of personal digital photos on the Web makes their management, retrieval and visualization a difficult task. To annotate these images using Semantic Web techno...
Windson Viana, José Bringel Filho, Jé...
DTJ
1998
171views more  DTJ 1998»
14 years 9 months ago
Measurement and Analysis of C and C++ Performance
ir increasing use of abstraction, modularity, delayed binding, polymorphism, and source reuse, especially when these attributes are used in combination. Modern processor architectu...
Hemant G. Rotithor, Kevin W. Harris, Mark W. Davis