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DAC
2001
ACM
16 years 5 months ago
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
Li Chen, Xiaoliang Bai, Sujit Dey
ICCD
2006
IEEE
116views Hardware» more  ICCD 2006»
16 years 1 months ago
RTL Scan Design for Skewed-Load At-speed Test under Power Constraints
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
Ho Fai Ko, Nicola Nicolici
ICFEM
2009
Springer
15 years 10 months ago
Implementing and Applying the Stocks-Carrington Framework for Model-Based Testing
In this paper we describe the functional features and the architecture of a tool implementing the Stocks-Carrington framework (TTF) for model based testing (MBT). The resulting pro...
Maximiliano Cristiá, Pablo Rodríguez...
SAFECOMP
2007
Springer
15 years 10 months ago
Improving Test Coverage for UML State Machines Using Transition Instrumentation
We discuss the problem of generating test suites from UML state machines and present a method to extend the capabilities of existing automated test case generators. Current tools p...
Mario Friske, Bernd-Holger Schlingloff
GECCO
2005
Springer
113views Optimization» more  GECCO 2005»
15 years 9 months ago
Search-based mutation testing for Simulink models
The efficient and effective generation of test-data from high-level models is of crucial importance in advanced modern software engineering. Empirical studies have shown that muta...
Yuan Zhan, John A. Clark