3527 search results - page 198 / 706 » Test Automation in Practice |
131
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ICASSP
2008
IEEE
15 years 11 months ago
2008
IEEE
On open and controversial issue in empirical data analysis is to decide whether scaling and multifractal properties observed in empirical data actually exist, or whether they are ...
114
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ITC
1998
IEEE
15 years 8 months ago
1998
IEEE
Advances in semiconductor process and design technology enable the design of complex system chips. Traditional IC design, in which every circuit is designed from scratch and reuse...
161
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COLT
2007
Springer
15 years 8 months ago
2007
Springer
We study generalized bootstrapped confidence regions for the mean of a random vector whose coordinates have an unknown dependence structure, with a non-asymptotic control of the co...
143
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GI
2009
Springer
15 years 2 months ago
2009
Springer
: ConnectIT uses a graphical representation to express strategies for playing the connect-four game. With this tool we can transfer complex knowledge about the connect-four game it...
124
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DAC
2003
ACM
16 years 5 months ago
2003
ACM
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...