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» Test Automation in Practice

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DAC
2007
ACM

126views Computer Architecture» more DAC 2007»

Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design

15 years 10 months ago

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Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...

Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram

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109

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ISSRE
2007
IEEE

151views Software Engineering» more ISSRE 2007»

Using In-Process Testing Metrics to Estimate Post-Release Field Quality

14 years 11 months ago

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In industrial practice, information on the software field quality of a product is available too late in the software lifecycle to guide affordable corrective action. An important ...

Nachiappan Nagappan, Laurie Williams, Mladen A. Vo...

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DAC
2004
ACM

128views Computer Architecture» more DAC 2004»

Theoretical and practical limits of dynamic voltage scaling

15 years 10 months ago