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TPHOL
2005
IEEE
15 years 3 months ago
A Structured Set of Higher-Order Problems
Abstract. We present a set of problems that may support the development of calculi and theorem provers for classical higher-order logic. We propose to employ these test problems as...
Christoph Benzmüller, Chad E. Brown
AOSD
2009
ACM
15 years 4 months ago
Automated test data generation for aspect-oriented programs
Despite the upsurge of interest in the Aspect-Oriented Programming (AOP) paradigm, there remain few results on test data generation techniques for AOP. Furthermore, there is no wo...
Mark Harman, Fayezin Islam, Tao Xie, Stefan Wapple...
ITC
1999
IEEE
118views Hardware» more  ITC 1999»
15 years 2 months ago
Logic BIST for large industrial designs: real issues and case studies
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...
Graham Hetherington, Tony Fryars, Nagesh Tamarapal...
ERLANG
2003
ACM
15 years 3 months ago
Automated test generation for industrial Erlang applications
We present an implemented technique for generating test cases from state machine specifications. The work is motivated by a need for testing of protocols and services developed b...
Johan Blom, Bengt Jonsson
GI
2007
Springer
15 years 3 months ago
Test Automation Meets Static Analysis
: In this article we advocate an integrated approach for the automation of module or software integration testing and static analysis. It is illustrated how funmethods of static an...
Jan Peleska, Helge Löding, Tatiana Kotas