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KBSE
2003
IEEE
15 years 3 months ago
Automated Requirements-based Generation of Test Cases for Product Families
Clémentine Nebut, Simon Pickin, Yves Le Tra...
DATE
2002
IEEE
126views Hardware» more  DATE 2002»
15 years 2 months ago
Automated Modeling of Custom Digital Circuits for Test
Models meant for logic verification and simulation are often used for ATPG. For custom digital circuits, these models contain many tristate devices, which leads to lower fault co...
Soumitra Bose