3527 search results - page 500 / 706 » Test Automation in Practice |
DAC
2009
ACM
15 years 11 months ago
2009
ACM
Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the Complementary Metal-Oxide-Semiconductor (CMOS)...
DAC
2008
ACM
15 years 11 months ago
2008
ACM
In recent literature it has been reported that Dynamic Power Management (DPM) may lead to decreased reliability in real-time embedded systems. The ever-shrinking device sizes cont...
DAC
2008
ACM
2008
ACM
Model checking based analysis of end-to-end latency in embedded, real-time systems with clock drifts
15 years 11 months ago
End-to-end latency of messages is an important design parameter that needs to be within specified bounds for the correct functioning of distributed real-time control systems. In t...
DAC
2008
ACM
15 years 11 months ago
2008
ACM
Clock gating is the insertion of combinational logic along the clock path to prevent the unnecessary switching of registers and reduce dynamic power consumption. The conditions un...
100
click to vote
DAC
2008
ACM
15 years 11 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...