3527 search results - page 665 / 706 » Test Automation in Practice |
ICCAD
2001
IEEE
15 years 6 months ago
2001
IEEE
In high-speed digital VLSI design, bounding the load capacitance at gate outputs is a well-known methodology to improve coupling noise immunity, reduce degradation of signal trans...
SOSP
2007
ACM
15 years 6 months ago
2007
ACM
This paper describes the design, implementation, and evaluation of a replication scheme to handle Byzantine faults in transaction processing database systems. The scheme compares ...
SOSP
2009
ACM
15 years 6 months ago
2009
ACM
Bugs in kernel extensions remain one of the main causes of poor operating system reliability despite proposed techniques that isolate extensions in separate protection domains to ...
SENSYS
2009
ACM
15 years 4 months ago
2009
ACM
Network protocols are typically designed and tested individually. In practice, however, applications use multiple protocols concurrently. This discrepancy can lead to failures fro...
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ICAC
2009
IEEE
15 years 4 months ago
2009
IEEE
The complexity of large computer systems has raised unprecedented challenges for system management. In practice, operators often collect large volume of monitoring data from system...