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» Test Data Compression: The System Integrator's Perspective
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ASPDAC
2008
ACM
115views Hardware» more  ASPDAC 2008»
13 years 8 months ago
GECOM: Test data compression combined with all unknown response masking
This paper introduces GECOM technology, a novel test compression method with seamless integration of test GE
Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsu...
HIS
2004
13 years 7 months ago
Hybrid Learning Scheme for Data Mining Applications
Classification of large datasets is a challenging task in Data Mining. In the current work, we propose a novel method that compresses the data and classifies the test data directl...
T. Ravindra Babu, M. Narasimha Murty, Vijay K. Agr...
DDECS
2007
IEEE
105views Hardware» more  DDECS 2007»
14 years 23 days ago
A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
DOLAP
2010
ACM
13 years 3 months ago
Integrating OLAP and recommender systems: an evaluation perspective
The integration of OLAP with web-search technologies is a promising research topic. Recommender systems are popular web-search mechanisms, because they can address information ove...
Artus Krohn-Grimberghe, Alexandros Nanopoulos, Lar...
IFIP
2004
Springer
13 years 11 months ago
Three decades of data integration - All problems solved?
Data integration is one of the older research fields in the database area and has emerged shortly after database systems were first introduced into the business world. In this pa...
Patrick Ziegler, Klaus R. Dittrich