1812 search results - page 72 / 363 » Test Early, Test Often |
DATE
2005
IEEE
15 years 3 months ago
2005
IEEE
We present a hybrid BIST approach that extracts the most frequently occurring sequences from deterministic test patterns; these extracted sequences are stored on-chip. We use clus...
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
DAC
2004
ACM
15 years 1 months ago
2004
ACM
Random test generators are often used to create regression suites on-the-fly. Regression suites are commonly generated by choosing several specifications and generating a number o...
ESA
2008
Springer
14 years 11 months ago
2008
Springer
We experimentally study the reliability of geometric software for point location in simple polygons. As expected, the code we tested works very well for random query points. Howeve...
CHI
2004
ACM
15 years 10 months ago
2004
ACM
Heuristics have become an accepted and widely used adjunct method of usability evaluation in Internet and software development. This report introduces Heuristic Evaluation for Pla...