1422 search results - page 11 / 285 » Test Generation Algorithms Based on Preorder Relations |
KBSE
2007
IEEE
15 years 3 months ago
2007
IEEE
Randomized testing has been shown to be an effective method for testing software units. However, the thoroughness of randomized unit testing varies widely according to the settin...
ISCAS
1999
IEEE
15 years 1 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
SIU
2002
14 years 9 months ago
2002
Abstract. In order to verify and test the performance of new packing algorithms relative to existing algorithms, test problems are needed. The scope of published test instances for...
ICCAD
2000
IEEE
15 years 2 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
COMPSAC
2003
IEEE
15 years 2 months ago
2003
IEEE
One of the important tasks during software testing is the generation of test cases. Various approaches have been proposed to automate this task. The approaches available, however,...