1422 search results - page 12 / 285 » Test Generation Algorithms Based on Preorder Relations |
80
Voted
CEC
2007
IEEE
15 years 4 months ago
2007
IEEE
— One of the main tasks software testing involves is the generation of the test cases to be used during the test. Due to its expensive cost, the automation of this task has becom...
122
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ICST
2009
IEEE
14 years 7 months ago
2009
IEEE
Euclide is a new Constraint-Based Testing tool for verifying safety-critical C programs. By using a mixture of symbolic and numerical analyses (namely static single assignment for...
SIGSOFT
2007
ACM
15 years 10 months ago
2007
ACM
There has recently been a great deal of interest in search? based test data generation, with many local and global search algorithms being proposed. However, to date, there has be...
DATE
1999
IEEE
15 years 1 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
VTS
1999
IEEE
15 years 1 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...