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» Test Generation Algorithms Based on Preorder Relations
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ICST
2008
IEEE
15 years 4 months ago
Testing Java Components based on Algebraic Specifications
This paper presents a method of component testing based on algebraic specifications. An algorithm for generating checkable test cases is proposed. A prototype testing tool called ...
Bo Yu, Liang Kong, Yufeng Zhang, Hong Zhu
CSB
2003
IEEE
15 years 3 months ago
Group Testing With DNA Chips: Generating Designs and Decoding Experiments
DNA microarrays are a valuable tool for massively parallel DNA-DNA hybridization experiments. Currently, most applications rely on the existence of sequence-specific oligonucleot...
Alexander Schliep, David C. Torney, Sven Rahmann
ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
15 years 2 months ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
FUIN
2007
147views more  FUIN 2007»
14 years 9 months ago
Privacy Preserving Database Generation for Database Application Testing
Testing of database applications is of great importance. Although various studies have been conducted to investigate testing techniques for database design, relatively few efforts ...
Xintao Wu, Yongge Wang, Songtao Guo, Yuliang Zheng
DATE
2000
IEEE
132views Hardware» more  DATE 2000»
15 years 2 months ago
Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...