Sciweavers

1422 search results - page 17 / 285
» Test Generation Algorithms Based on Preorder Relations
Sort
View
EURODAC
1995
IEEE
164views VHDL» more  EURODAC 1995»
15 years 1 months ago
Bottleneck removal algorithm for dynamic compaction and test cycles reduction
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
Srimat T. Chakradhar, Anand Raghunathan
TACAS
2005
Springer
158views Algorithms» more  TACAS 2005»
15 years 3 months ago
Symstra: A Framework for Generating Object-Oriented Unit Tests Using Symbolic Execution
Object-oriented unit tests consist of sequences of method invocations. Behavior of an invocation depends on the method’s arguments and the state of the receiver at the beginning ...
Tao Xie, Darko Marinov, Wolfram Schulte, David Not...
DAC
1998
ACM
15 years 10 months ago
Practical Experiences with Standard-Cell Based Datapath Design Tools: Do We Really Need Regular Layouts?
Commercial tools for standard-cell based datapath design are here classed according to design flows, and the advantages of each class are discussed with the results of two test ci...
Alexander Grießing, Paolo Ienne
JCDL
2004
ACM
125views Education» more  JCDL 2004»
15 years 3 months ago
Generating fuzzy semantic metadata describing spatial relations from images using the R-histogram
Automatic generation of semantic metadata describing spatial relations is highly desirable for image digital libraries. Relative spatial relations between objects in an image conv...
Yuhang Wang, Fillia Makedon, James Ford, Li Shen, ...
VLSID
2009
IEEE
150views VLSI» more  VLSID 2009»
15 years 10 months ago
TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis...