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» Test Generation Algorithms Based on Preorder Relations
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EURODAC
1990
IEEE
92views VHDL» more  EURODAC 1990»
15 years 1 months ago
Accelerated test pattern generation by cone-oriented circuit partitioning
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...
Torsten Grüning, Udo Mahlstedt, Wilfried Daeh...
SIGSOFT
2007
ACM
15 years 10 months ago
Improving test case generation for web applications using automated interface discovery
With the growing complexity of web applications, identifying web interfaces that can be used for testing such applications has become increasingly challenging. Many techniques tha...
William G. J. Halfond, Alessandro Orso
104
Voted
ICST
2009
IEEE
15 years 4 months ago
Generating Feasible Transition Paths for Testing from an Extended Finite State Machine (EFSM)
The problem of testing from an extended finite state machine (EFSM) can be expressed in terms of finding suitable paths through the EFSM and then deriving test data to follow the ...
Abdul Salam Kalaji, Robert M. Hierons, Stephen Swi...
STACS
2010
Springer
15 years 4 months ago
Quantum Algorithms for Testing Properties of Distributions
Abstract. Suppose one has access to oracles generating samples from two unknown probability distributions p and q on some N-element set. How many samples does one need to test whet...
Sergey Bravyi, Aram Wettroth Harrow, Avinatan Hass...
ICST
2010
IEEE
14 years 8 months ago
Timed Moore Automata: Test Data Generation and Model Checking
Abstract—In this paper we introduce Timed Moore Automata, a specification formalism which is used in industrial train control applications for specifying the real-time behavior ...
Helge Löding, Jan Peleska