Sciweavers

1422 search results - page 21 / 285
» Test Generation Algorithms Based on Preorder Relations
Sort
View
ICST
2009
IEEE
15 years 4 months ago
PKorat: Parallel Generation of Structurally Complex Test Inputs
Constraint solving lies at the heart of several specification-based approaches to automated testing. Korat is a previously developed algorithm for solving constraints in Java pro...
Junaid Haroon Siddiqui, Sarfraz Khurshid
BMCBI
2007
179views more  BMCBI 2007»
14 years 9 months ago
rMotifGen: random motif generator for DNA and protein sequences
Background: Detection of short, subtle conserved motif regions within a set of related DNA or amino acid sequences can lead to discoveries about important regulatory domains such ...
Eric C. Rouchka, C. Timothy Hardin
VTS
1997
IEEE
96views Hardware» more  VTS 1997»
15 years 1 months ago
Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
GLVLSI
2002
IEEE
108views VLSI» more  GLVLSI 2002»
15 years 2 months ago
Protected IP-core test generation
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
Alessandro Fin, Franco Fummi
KDD
2003
ACM
205views Data Mining» more  KDD 2003»
15 years 10 months ago
The data mining approach to automated software testing
In today's industry, the design of software tests is mostly based on the testers' expertise, while test automation tools are limited to execution of pre-planned tests on...
Mark Last, Menahem Friedman, Abraham Kandel