1422 search results - page 4 / 285 » Test Generation Algorithms Based on Preorder Relations |
JSS
2008
14 years 8 months ago
2008
This report presents a model-driven, stress test methodology aimed at increasing chances of discovering faults related to network traffic in Distributed Real-Time Systems (DRTS). T...
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ACMSE
2006
ACM
15 years 3 months ago
2006
ACM
Like in other fields, computer products (applications, hardware, etc.), before being marketed, require some level of testing to verify whether they meet their design and function...
TACAS
2005
Springer
15 years 3 months ago
2005
Springer
This paper addresses the problem of generating symbolic test cases for testing the conformance of a black-box implementation with respect to a specification, in the context of rea...
IWANN
2009
Springer
15 years 4 months ago
2009
Springer
Generating test data for formal state based specifications is computationally expensive. This paper improves a framework that addresses this issue by representing the test data ge...
VLSID
1997
IEEE
15 years 1 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...