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» Test Generation Algorithms Based on Preorder Relations
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ENTCS
2007
115views more  ENTCS 2007»
14 years 9 months ago
A Global Algorithm for Model-Based Test Suite Generation
Abstract. Model-based testing has been proposed as a technique to automatically verify that a system conforms to its specification. A popular approach is to use a model-checker to...
Anders Hessel, Paul Pettersson
VLSID
1993
IEEE
136views VLSI» more  VLSID 1993»
15 years 1 months ago
A Simulation-Based Test Generation Scheme Using Genetic Algorithms
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
M. Srinivas, Lalit M. Patnaik
70
Voted
DAC
1991
ACM
15 years 1 months ago
A Transitive Closure Based Algorithm for Test Generation
Srimat T. Chakradhar, Vishwani D. Agrawal
ITC
1994
IEEE
136views Hardware» more  ITC 1994»
15 years 1 months ago
An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
FMCO
2006
Springer
109views Formal Methods» more  FMCO 2006»
15 years 1 months ago
Model-Based Testing of Environmental Conformance of Components
Abstract. In component-based development, the correctness of a system depends on the correctness of the individual components and on their interactions. Model-based testing is a wa...
Lars Frantzen, Jan Tretmans