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» Test Generation Algorithms Based on Preorder Relations
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SAC
2006
ACM
14 years 9 months ago
A new method of generating synchronizable test sequences that detect output-shifting faults based on multiple UIO sequences
The objective of testing is to determine the conformance between a system and its specification. When testing distributed systems, the existence of multiple testers brings out the...
Kai Chen, Fan Jiang, Chuan-dong Huang
ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
15 years 3 months ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...
IICAI
2007
14 years 11 months ago
Automated Test Generation from Models Based on Functional Software Specifications
The paper presents first results of a project that aims at building a model-based tool for functional testing of control software for passenger vehicles. The objective is that this...
Michael Esser, Peter Struss
EURODAC
1994
IEEE
148views VHDL» more  EURODAC 1994»
15 years 1 months ago
BiTeS: a BDD based test pattern generator for strong robust path delay faults
This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are ...
Rolf Drechsler
EMSOFT
2008
Springer
14 years 11 months ago
Quantitative testing
We investigate the problem of specification based testing with dense sets of inputs and outputs, in particular with imprecision as they might occur due to errors in measurements, ...
Henrik C. Bohnenkamp, Mariëlle Stoelinga