1016 search results - page 68 / 204 » Test Generation for Designs with On-Chip Clock Generators |
GI
2007
Springer
15 years 1 months ago
2007
Springer
: Test-case generation with model-checkers is a promising field of research in software testing. Model-checker based approaches offer many advantages: They are fully automated, the...
ICES
2000
Springer
15 years 1 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
SIGMOD
2010
ACM
15 years 1 months ago
2010
ACM
A database application differs form regular applications in that some of its inputs may be database queries. The program will execute the queries on a database and may use any re...
ITC
2002
IEEE
15 years 2 months ago
2002
IEEE
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...
TVLSI
2008
14 years 9 months ago
2008
Much effort in register transfer level (RTL) design has been devoted to developing "push-button" types of tools. However, given the highly complex nature, and lack of con...