1016 search results - page 88 / 204 » Test Generation for Designs with On-Chip Clock Generators |
164
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ICCAD
2003
IEEE
15 years 10 months ago
2003
IEEE
The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from spa...
149
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EMSOFT
2004
Springer
15 years 10 months ago
2004
Springer
Dataflow synchronous languages have attracted considerable interest in domains such as real-time control and hardware design. The potential benefits are promising: Discrete-time...
148
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ISCA
1999
IEEE
15 years 9 months ago
1999
IEEE
In the pursuit of instruction-level parallelism, significant demands are placed on a processor's instruction delivery mechanism. Delivering the performance necessary to meet ...
150
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BMCBI
2008
15 years 5 months ago
2008
Background: A key goal of drug discovery is to increase the throughput of small molecule screens without sacrificing screening accuracy. High-throughput screening (HTS) in drug di...
151
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SC
2009
ACM
15 years 10 months ago
2009
ACM
Reconfigurable computing (RC) is rapidly becoming a vital technology for many applications, from high-performance computing to embedded systems. The inherent advantages of custom-...