77 search results - page 14 / 16 » Test Generation for Global Delay Faults |
SRDS
1993
IEEE
15 years 1 months ago
1993
IEEE
We propose a simple and practical probabilistic comparison-based model, employing multiple incomplete test concepts, for handling fault location in distributed systems using a Bay...
SRDS
2008
IEEE
15 years 3 months ago
2008
IEEE
Firewalls are the mainstay of enterprise security and the most widely adopted technology for protecting private networks. As the quality of protection provided by a firewall dire...
VTS
2008
IEEE
15 years 3 months ago
2008
IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
DAC
2006
ACM
14 years 11 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
TCAD
2002
14 years 9 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...