77 search results - page 4 / 16 » Test Generation for Global Delay Faults |
ETS
2006
IEEE
15 years 3 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
VLSID
1995
IEEE
15 years 1 months ago
1995
IEEE
ASPDAC
2008
ACM
14 years 11 months ago
2008
ACM
TODAES
1998
14 years 9 months ago
1998
DATE
2007
IEEE
15 years 3 months ago
2007
IEEE
A high-level test synthesis (HLTS) method targeted for delay fault testability is presented. The proposed method, when combined with hierarchical test pattern generation for embed...