203 search results - page 10 / 41 » Test Pattern Generator for Delay Faults |
TODAES
1998
14 years 9 months ago
1998
VLSID
1995
IEEE
15 years 1 months ago
1995
IEEE
ASPDAC
2008
ACM
14 years 11 months ago
2008
ACM
ICCAD
1998
IEEE
15 years 1 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
TCAD
2002
14 years 9 months ago
2002
This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HCA is developed over the Galois extension field (2 ), where each cell of the CA can store ...