203 search results - page 15 / 41 » Test Pattern Generator for Delay Faults |
111
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ITC
2003
IEEE
15 years 7 months ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
105
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ATS
2003
IEEE
15 years 7 months ago
2003
IEEE
Software-based self-testing is a promising approach for the testing of processor cores which are embedded inside a System-on-a-Chip (SoC), as it can apply test vectors in function...
111
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ETS
2009
IEEE
14 years 11 months ago
2009
IEEE
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
106
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DAC
1997
ACM
15 years 6 months ago
1997
ACM
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
124
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DATE
2009
IEEE
15 years 8 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...