203 search results - page 26 / 41 » Test Pattern Generator for Delay Faults |
124
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DATE
2000
IEEE
15 years 6 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
105
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ICCD
2002
IEEE
15 years 10 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
136
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COMPSAC
1999
IEEE
15 years 6 months ago
1999
IEEE
Design patterns have been used in object-oriented frameworks such as the IBM San Francisco framework, Apple's Rhaspody, OpenStep, and WebObjects, and DIWB. However, few guide...
100
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VTS
1999
IEEE
15 years 6 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
122
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ITC
1992
IEEE
15 years 6 months ago
1992
IEEE
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...